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Download Atomic Force Microscopy: Understanding Basic Modes and by Greg Haugstad PDF

By Greg Haugstad

This book enlightens readers on the simple floor houses and distance-dependent intersurface forces one needs to comprehend to acquire even uncomplicated information from an atomic strength microscope (AFM). the fabric turns into increasingly more advanced in the course of the e-book, explaining info of calibration, actual beginning of artifacts, and signal/noise barriers. insurance spans imaging, fabrics estate characterization, in-liquid interfacial research, tribology, and electromagnetic interactions.

“Supplementary fabric for this e-book are available through coming into ISBN 9780470638828 on”

Chapter 1 assessment of AFM (pages 1–32):
Chapter 2 Distance?Dependent Interactions (pages 33–90):
Chapter three Z?Dependent strength Measurements with AFM (pages 91–136):
Chapter four Topographic Imaging (pages 137–186):
Chapter five Probing fabric homes I: part Imaging (pages 187–257):
Chapter 6 Probing fabric homes II: Adhesive Nanomechanics and Mapping Distance?Dependent Interactions (pages 258–329):
Chapter 7 Probing fabric homes III: Lateral strength equipment (pages 330–378):
Chapter eight information Post?Processing and Statistical research (pages 379–399):
Chapter nine complicated Dynamic strength equipment (pages 400–436):

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Additional resources for Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Sample text

But this vertical cycle is not produced by the Z scanner; the vibrating cantilever does all the work. The amplitude of vertical tip oscillation must be sufficiently large to overcome adhesion between tip and surface. The amplitude also is commonly used to enable the tracking of surface topography, but with a number of caveats and potential pitfalls, as described in detail in Chapters 4 and 5. Tracking means that the Z scanner reactively displaces the distance between oscillating tip and sample to keep the tip amplitude constant, reduced from its amplitude when free of the surface.

Measuring a phenomenon that changes with distance, in order to gauge distance, is not a new concept. A pressure altimeter measures the elevation of an airplane via Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications, First Edition. Greg Haugstad. Ó 2012 John Wiley & Sons, Inc. Published 2012 by John Wiley & Sons, Inc. 33 34 DISTANCE-DEPENDENT INTERACTIONS the decrease of air pressure as a function of vertical distance (above sea level). An exponential relationship between air pressure P and elevation Z PðZÞ ¼ P0 expðÀmgZ=RTÞ ð2:1Þ (with m ¼ average molecular mass, T ¼ average temperature at sea level, and R ¼ gas law constant) can be plotted as linear on a semilog scale, giving utility over a wide range of distances provided reasonable signal/noise in the measurements at large distance.

1 This decrease of force with distance is many decades steeper than the Coulomb attraction or repulsion of (unlikeor like-charged) ions. Given such a steep force–distance relationship, one 1 This is assuming nonretarded interactions, that one dipole senses the state of the other instantaneously; in truth, there is a finite time for the interactions to propagate at the speed of light. ” In crossed cylinder experiments, the retarded regime has been identified at distances greater than roughly 20 nm.

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